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BibTeX file of [Galli15] [show it without abstract]

@article{Galli15,
    author={Lorenzo Galli and Sang-Kil Son and Thomas A. White and Robin Santra and Henry N. Chapman and Max H. Nanao},
    title={Towards {RIP} using free electron laser {SFX} data},
    journal={J. Synchrotron Radiat.},
    volume={22},
    pages={249--255},
    year={2015},
    keywords={HIP; high-intensity phasing; RIP; HI-RIP; MAD; x-ray crystallography; SFX; radiation damage; phase problem; XFEL; XATOM; CFEL; DESY;},
    url={https://doi.org/10.1107/S1600577514027854},
    doi={10.1107/S1600577514027854},
    abstract={Here, it is shown that simulated native serial femtosecond crystallography (SFX) cathepsin B data can be phased by rapid ionization of sulfur atoms. Utilizing standard software adopted for radiation-damage-induced phasing (RIP), the effects on both substructure determination and phasing of the number of collected patterns and fluences are explored for experimental conditions already available at current free-electron laser facilities.} }

Lorenzo Galli, Sang-Kil Son, Thomas A. White, Robin Santra, Henry N. Chapman, and Max H. Nanao, Towards RIP using free electron laser SFX data, J. Synchrotron Radiat. 22, 249–255 (2015) [abstract][abstract][link]doi:10.1107/S1600577514027854


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