Towards RIP using free electron laser SFX data

Lorenzo Galli, Sang-Kil Son, Thomas A. White, Robin Santra, Henry N. Chapman, and Max H. Nanao

[BibTeX]doi:10.1107/S1600577514027854

Here, it is shown that simulated native serial femtosecond crystallography (SFX) cathepsin B data can be phased by rapid ionization of sulfur atoms. Utilizing standard software adopted for radiation-damage-induced phasing (RIP), the effects on both substructure determination and phasing of the number of collected patterns and fluences are explored for experimental conditions already available at current free-electron laser facilities.

Tags: HIP, high-intensity phasing, RIP, HI-RIP, MAD, x-ray crystallography, SFX, radiation damage, phase problem, XFEL, XATOM, CFEL, DESY