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Abstract of [Galli15]

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Towards RIP using free electron laser SFX data

Lorenzo Galli, Sang-Kil Son, Thomas A. White, Robin Santra, Henry N. Chapman, and Max H. Nanao

J. Synchrotron Radiat. 22, 249–255 (2015)


Here, it is shown that simulated native serial femtosecond crystallography (SFX) cathepsin B data can be phased by rapid ionization of sulfur atoms. Utilizing standard software adopted for radiation-damage-induced phasing (RIP), the effects on both substructure determination and phasing of the number of collected patterns and fluences are explored for experimental conditions already available at current free-electron laser facilities.

Tags: HIP, high-intensity phasing, RIP, HI-RIP, MAD, x-ray crystallography, SFX, radiation damage, phase problem, XFEL, XATOM, CFEL, DESY

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