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Abstract of [Abdullah15]

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Spatial beam profile-induced effects in x-ray scattering pattern at high intensity

Malik Muhammad Abdullah, Zoltan Jurek, Sang-Kil Son, and Robin Santra

XXIX International Conference on Photonic, Electronic and Atomic Collisions
(Toledo, Spain, July 22-28, 2015)


Simulation of high-intensity x-ray scattering from a crystal that is larger than the transverse x-ray beam profile is presented. We consider a crystal with a size of a micron, when irradiated by an x-ray beam having a focus of 100 nm. We discuss the methodological challenges that had to be overcome in order to calculate the x-ray scattering pattern. Our calculations enable us to identify the characteristic features of the spatial beam profile imprinted in the scattering pattern. The abstract is published in J. Phys.: Conf. Ser. 635, 102008 (2015).


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