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Towards RIP using free electron laser SFX data
Lorenzo Galli, Sang-Kil Son, Thomas A. White, Robin Santra, Henry N. Chapman, and Max H. Nanao
J. Synchrotron Radiat. 22, 249–255 (2015) [BibTeX] doi:10.1107/S1600577514027854
Here, it is shown that simulated native serial femtosecond crystallography (SFX) cathepsin B data can be phased by rapid ionization of sulfur atoms. Utilizing standard software adopted for radiation-damage-induced phasing (RIP), the effects on both substructure determination and phasing of the number of collected patterns and fluences are explored for experimental conditions already available at current free-electron laser facilities. Tags: HIP,
high-intensity phasing,
RIP,
HI-RIP,
MAD,
x-ray crystallography,
SFX,
radiation damage,
phase problem,
XFEL,
XATOM,
CFEL,
DESY
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