All citations with Sang-Kil Son containing “SFX” and “DESY”

1. Lorenzo Galli, Sang-Kil Son, Thomas A. White, Robin Santra, Henry N. Chapman, and Max H. Nanao, Towards RIP using free electron laser SFX data, J. Synchrotron Radiat. 22, 249–255 (2015) [BibTeX][abstract]doi:10.1107/S1600577514027854
2. Lorenzo Galli, Sang-Kil Son, M. Klinge, S. Bajt, A. Barty, R. Bean, C. Betzel, K. R. Beyerlein, C. Caleman, R. B. Doak, M. Duszenko, H. Fleckenstein, C. Gati, B. Hunt, R. A. Kirian, M. Liang, M. H. Nanao, K. Nass, D. Oberthür, L. Redecke, R. Shoeman, F. Stellato, C. H. Yoon, T. A. White, O. Yefanov, J. Spence, and H. N. Chapman, Electronic damage in S atoms in a native protein crystal induced by an intense x-ray free-electron laser pulse, Struct. Dyn. 2, 041703 (2015) [special issue on biology with x-ray lasers 2] [BibTeX][pdf][abstract]doi:10.1063/1.4919398
3. Lorenzo Galli, Sang-Kil Son, Thomas R.M. Barends, Thomas A. White, Anton Barty, Sabine Botha, Sébastien Boutet, Carl Caleman, Bruce R. Doak, Max H. Nanao, Karol Nass, Robert L. Schoeman, Nicusor Timneanu, Robin Santra, Ilme Schlichting, and Henry N. Chapman, Towards phasing using high x-ray intensity, IUCrJ 2, 627–634 (2015) [BibTeX][pdf][abstract]doi:10.1107/S2052252515014049
4. Sang-Kil Son, High-intensity phasing with x-ray free-electron lasers in CCP4 Study Weekend (Nottingham, United Kingdom, January 7-9, 2015) [invited talk] [BibTeX][slide: 5Mb][abstract][link]
5. Sang-Kil Son, Phasing with electronic radiation damage at high x-ray intensity in BioXFEL STC 2nd Annual International Conference (Ponce, Puerto Rico, January 14-16, 2015) [invited talk] [BibTeX][slide: 6Mb][abstract][link]
6. Sang-Kil Son, Lorenzo Galli, Henry N. Chapman, and Robin Santra, High-intensity phasing 
with x-ray free-electron lasers in European XFEL and DESY Photon Science Users' Meeting (DESY, Hamburg, Germany, January 28-30, 2015) [poster] [BibTeX][poster: 4Mb][abstract][link]
7. Malik Muhammad Abdullah, Sang-Kil Son, Zoltan Jurek, and Robin Santra, Towards the theoretical limitations of x-ray nanocrystallography at high intensity: the validity of the effective-form-factor description, IUCrJ 5, 699–705 (2018) [BibTeX][pdf][abstract]doi:10.1107/S2052252518011442

made by ZN / powered by Bibliophile