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All publications with Sang-Kil Son containing “MAD”

[BibTeX data] [text only]
  1. Sang-Kil Son, Henry N. Chapman, and Robin Santra, Multiwavelength anomalous diffraction at high x-ray intensity, Phys. Rev. Lett. 107, 218102 (2011) [bib][BibTeX][pdf][pdf][abstract][abstract][link]doi:10.1103/PhysRevLett.107.218102
  2. Sang-Kil Son, Henry N. Chapman, and Robin Santra, Determination of multiwavelength anomalous diffraction coefficients at high x-ray intensity, J. Phys. B: At. Mol. Opt. Phys. 46, 164015 (2013) [special issue on frontiers of free-electron laser science] [bib][BibTeX][pdf][pdf][abstract][abstract][link][link][link]doi:10.1088/0953-4075/46/16/164015
  3. Lorenzo Galli, Sang-Kil Son, Thomas A. White, Robin Santra, Henry N. Chapman, and Max H. Nanao, Towards RIP using free electron laser SFX data, J. Synchrotron Radiat. 22, 249–255 (2015) [bib][BibTeX][abstract][abstract][link]doi:10.1107/S1600577514027854
  4. Lorenzo Galli, Sang-Kil Son, M. Klinge, S. Bajt, A. Barty, R. Bean, C. Betzel, K. R. Beyerlein, C. Caleman, R. B. Doak, M. Duszenko, H. Fleckenstein, C. Gati, B. Hunt, R. A. Kirian, M. Liang, M. H. Nanao, K. Nass, D. Oberthür, L. Redecke, R. Shoeman, F. Stellato, C. H. Yoon, T. A. White, O. Yefanov, J. Spence, and H. N. Chapman, Electronic damage in S atoms in a native protein crystal induced by an intense x-ray free-electron laser pulse, Struct. Dyn. 2, 041703 (2015) [special issue on biology with x-ray lasers 2] [bib][BibTeX][pdf][pdf][abstract][abstract][link]doi:10.1063/1.4919398
  5. Lorenzo Galli, Sang-Kil Son, Thomas R.M. Barends, Thomas A. White, Anton Barty, Sabine Botha, Sébastien Boutet, Carl Caleman, Bruce R. Doak, Max H. Nanao, Karol Nass, Robert L. Schoeman, Nicusor Timneanu, Robin Santra, Ilme Schlichting, and Henry N. Chapman, Towards phasing using high x-ray intensity, IUCrJ 2, 627–634 (2015) [bib][BibTeX][pdf][pdf][abstract][abstract][link]doi:10.1107/S2052252515014049
  6. Malik Muhammad Abdullah, Sang-Kil Son, Zoltan Jurek, and Robin Santra, Towards the theoretical limitations of x-ray nanocrystallography at high intensity: the validity of the effective-form-factor description, IUCrJ 5, 699–705 (2018) [bib][BibTeX][pdf][pdf][abstract][abstract][link]doi:10.1107/S2052252518011442

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